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Low-energy electron and ion induced surface processes, studies of novel surface species on Cu(100) and Si(111)7x7 by electron-based materials analysis techniques
| dc.contributor.author | Yu, Hui | en |
| dc.date.accessioned | 2006-07-28 19:09:33 (GMT) | |
| dc.date.available | 2006-07-28 19:09:33 (GMT) | |
| dc.date.issued | 1998 | en |
| dc.date.submitted | 1998 | en |
| dc.identifier.uri | http://hdl.handle.net/10012/349 | |
| dc.format | application/pdf | en |
| dc.format.extent | 2801664 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en | en |
| dc.publisher | University of Waterloo | en |
| dc.rights | Copyright: 1998, Yu, Hui. All rights reserved. | en |
| dc.subject | Harvested from Collections Canada | en |
| dc.title | Low-energy electron and ion induced surface processes, studies of novel surface species on Cu(100) and Si(111)7x7 by electron-based materials analysis techniques | en |
| dc.type | Doctoral Thesis | en |
| dc.pending | false | en |
| uws-etd.degree | Ph.D. | en |
| uws.typeOfResource | Text | en |
| uws.peerReviewStatus | Unreviewed | en |
| uws.scholarLevel | Graduate | en |
