UWSpace will be migrating to a new version of its software from July 29th to August 1st. UWSpace will be offline for all UW community members during this time.
Browsing Theses by Subject "wafer probing"
Now showing items 1-1 of 1
-
Shape Optimization of Vertical-type Probe Needle Integrated with Floating Mount Technology
(University of Waterloo, 2014-01-09)Wafer probing is a testing process to inspect semiconductor wafers before packaging for defects by checking the electrical conductivity via physical contact between the wafers and the probe card. During the contact process, ...