Browsing Electrical and Computer Engineering by Author
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Browsing Electrical and Computer Engineering by Author "Samaan, Medhat"
Samaan, Medhat(University of Waterloo, 2021-05-14)
Atomic force microscope (AFM) is widely used for topographical structure characterization. However, one serious issue with AFM imaging is the intrinsic artifact in the AFM image when mapping a none-flat surface (e.g. a ...